DF高纯

DF-750 ULTRA是半导体行业水分分析的优选

DF-750 ULTRA是一种痕量/超痕量分析仪,经过优化,可对300毫米半导体工厂中使用的超高纯(UHP)气体进行行业高效的水分测量。

适用于半导体制造过程中质量控制应用的水分测量方案

Matt Chambers
纯度与专业业务部经理

DF-750 ULTRA专为在各种UHP气体中进行痕量和超痕量水分测量而设计,针对300mm半导体工厂进行了优化。它测量作为电子级气体氮气,氢气,氦气,氩气和氧气中污染物的水分。

可调谐二极管激光(TDL)传感技术可提供低至55 ppb(ppt)的检测下限(LDL),从而确保DF-750 ULTRA稳定,高精度的测量满足半导体生产的精确监控需求。

坚固的DF-750 ULTRA对使用寿命的维护要求低,并且具有零漂移稳定性,从而大大延长了校准间隔。这种低拥有成本与优异的测量性能相结合,意味着DF-750 ULTRA是用于UHP气体质量检查的优质分析解决方案。

高稳定性TDL迹线/超迹线测量

UHP电子气体的超痕量鉴定对于半导体制造至关重要。您需要水分分析仪
可以提供高稳定性的测量结果,并具有灵敏且一致的性能。准确而低的LDL是必需的,容易存储和调用数据/校准记录也是如此。无论您有什么要求,您都需要一种能够提高运行效率的水分分析仪。我们不相信你应该
必须妥协。

绝不妥协的解决方案

DF-750 ULTRA旨在满足全球半导体制造商所要求的优质的气体纯度标准。 DF-750 ULTRA利用先进的TDL传感技术,该技术安装在坚固且有弹性的Herriot Cell中,可避免水分与光学传感组件接触。结果是分析仪提供了超灵敏的,低至55ppt检测下限,非常适合在各种UHP电子等级中检查微量水分
气体,包括N2,H2,He,Ar和O2。 DF-750 ULTRA拥有记录的数据,并可以通过灵活的存储和调用功能随时获得,是300mm半导体工厂中UHP气体监测的完整解决方案。

维护简单,降低了运营成本

UHP电子气体的超痕量鉴定对于半导体制造至关重要。您需要水分分析仪
可以提供高稳定性的测量结果,并具有灵敏且一致的性能。准确而低的LDL是必需的,容易存储和调用数据/校准记录也是如此。无论您有什么要求,您都需要一种能够提高运行效率的水分分析仪。我们不相信你应该
必须妥协。

Servomex System components

为您提供专业的分析系统方案

如果您需要构建一套气体分析系统,仕富梅专家随时可以提供帮助。我们会提供项目设计、构建和安装等方面的全方位支持,通过自始至终的密切协作和项目管理,确保提供的方案满足您的应用需求。

如需订购,请参照以下基本流程

轻松找到适合自身应用的仕富梅产品。

Servomex UK technical center

询盘

联系我们,提出您的需求和目标应用

Servomex Gas System Schematics

咨询

我们的专家团队会帮助您选择合适的产品套件,包括相关配件和支持,确保为您提供更合适的分析仪

woman Assembling Sensors

成交

我们将在全球先进的工程中心装配好分析仪,并快速交付

The benefits of TDL moisture measurements

With low maintenance requirements and zero-drift stability, the DF-750 ULTRA provides high-specification measurement performance for a low cost of ownership.

存储和调取功能

校准,系统错误和测量数据有助于归档DF-750 ULTRA的运行历史记录。

业内领先的性能

DF-750 ULTRA具有极低的55ppt LDL,可提供半导体生产行业所需的灵敏度和精度。

可靠性高

通过更大程度地减少与光学组件的水接触,DF-750 ULTRA的可重复基线测量不受镜面反射率损失的影响,从而确保了准确性和稳定性。

非凡的性能
使用业界先进的高稳定性可调谐二极管激光器(TDL)轨迹感应,零漂移
耐气室污染分析:DF-750 ULTRA符合规范,信号损失高达90%
低至55ppt检测下限
由仕富梅(Servomex)制造-超过60年的开拓性气体分析经验
现场使用的数千个单位

灵活
广泛的检测范围:0-20ppm
存储和调用功能:校准,系统错误和测量数据有助于归档操作历史记录
可通过前面板或数字通讯选项进行操作

易于使用
通过使用无损耗,低漂移潜力的TDL传感技术,简化了日常维护要求
高可靠性-可重复进行的基线测量不受镜面反射率损失的影响

拥有成本低
坚固的传感器结构降低了维护要求
零漂移的缺失延长了校准间隔

符合基准
IEC 61010-1
II类过电压,污染等级2
欧盟EMC指令
欧盟低压指令

DF-750 ULTRA 采用行业领先、非消耗、高稳定性、零漂移的 TDL 痕量传感技术,可测量电子级气体中痕量和超痕量的水分。

加油站 测量
水蒸气(水分) (H₂O)ppm, ppb, ppt

Technologies

DF-750 ULTRA

證書

EC 61010-1

II类过电压,污染等级2

欧盟EMC指令
欧盟低压指令

原理图(选择展开)

[ngg src=”galleries” ids=”10″ display=”basic_thumbnail” thumbnail_crop=”0″ number_of_columns=”3″]

尺寸

483毫米(19英寸)宽x 266毫米(10.5英寸)高x 608毫米(23.9英寸)深

重量

<31.8公斤(70磅)

获取详细规格

“要获得深入的规范,您将需要下载我们的技术数据表,其中包括有关技术,性能,操作环境,样品条件和合规性的信息,以及技术图纸和顶级收益和应用。”

Matt Chambers
纯度与专业业务部经理

资源和下载

我们已经编译了全面的DF-750 ULTRA资源包,您可以一次下载所有资源。立即下载以了解有关产品功能,优势和技术规格的更多信息。

Matt Chambers
纯度与专业业务部经理

手册和手册

想更多地了解DF-750 ULTRA?下载产品手册和操作手册,以概述分析仪的优势和功能。

DF-750 ULTRA 使用说明书

DF-750 ULTRA 使用说明书

ES Semicon杂志第25期

ES Semicon杂志第25期

ES ULTRA系列杂志

ES ULTRA系列杂志

SERVOPRO DF-750 ULTRA
产品手册

SERVOPRO DF-750 ULTRA
产品手册

在我们正在进行的播客系列的最新一集中,了解您需要了解的关于我们著名的 SERVOPRO 水分气体分析仪系列 Gen-7 的所有信息。

Gen-7 Podcast transcript

DB: My name is Douglas Barth. I’m the USTC product manager for the DF-700, and I’m here today with…

PR: I’m Phil Rogers, and I am the senior applications engineer here at the USTC for Servomex.

DB: We are going to introduce you to the Generation Seven NanoTrace DF-700 analyzer. It’s a modern analyzer. It’s been recently re-engineered, redesigned…

PR: Re-engineered, updated.

DB: …For the modern LCD and LED manufacturing processes that require ultra-trace quality measurement for moisture, contaminants, and ultra-high-purity electronic grade gases. In such a demanding application, users need analysis capable of delivering high accuracy and low, ultra-low detection limits in multiple background gases. No matter how demanding the application requirement, you will want a device that reduces preventative maintenance costs, maximizes uptime and has a long life in the marketplace.

We don’t believe you should have to compromise, and that’s one of the reasons why we are so bullish on the DF-700 product. So, given that the previous generation is going to end its production run, Phil, can you tell some of the listeners why this new project has been undertaken?

PR: Oh, sure. The DF-700 has been around in its current iteration for about 20 years. That’s quite a long run with the same basic architecture. The circuit board designs are all old, very complicated wiring. It’s essentially an analog analyzer because, you know, the signal gets digitized at the end and… running out of suppliers for a lot of these old components, so we had to update the electronics and the processing power of the analyzer to something that’s current, that will be serviceable for years to come, and get us ready for the next 20 years.

DB: So this is a completely digital analyzer?

PR: Yes, it is, in fact, completely digital.

DB: Wow. Excellent. Yeah, I heard a lot about digitization in the industrial gas side of the business. Great to see that digitization is coming to the semiconductor side of those Servomex products. This new Generation Seven DF-700, how’s it better positioned for our customers in the future?

PR: I wouldn’t say so much that is better positioned, but certainly positioned well in a modern platform. The signal processing means that what we have at our disposal now with the digital instrument is much greater. This allows us to get a quieter signal out of the analyzer which will result in improved detection limits, response time, and elimination of events that are not moisture or oxygen-related. And so that in itself should make a huge difference to our end-users, especially those in the CQC world, the semiconductor manufacturers that are keeping these things running 24-7, 365.

DB: So you’re telling me that all-new electronics, new PCB, hard drive, operating system… so everything is contemporary within the analyzer for this new digital platform? Have you updated the laser cell?

PR: The laser cell itself is essentially unchanged. Herriott cell design doesn’t, you know… you can’t really improve on that. It’s a simple design that’s robust and durable. And so, we are using the exact same cell, exact same lasers, the exact same mirrors. But what we’re doing is we’re getting the signal out of there in a different fashion.

DB: That’s awesome. So I can understand now how this digital platform with all these new pieces are coming together to improve the operation of the instrument. What will the actual customers see on their side of the analyzer from all these new additions that are made in this redesign?

PR: You know, from the outside, the analyzer looks essentially the same. The screen is much bigger, and much brighter, so it’s easier to read and more information can be displayed on the screen in a clear and understandable way. You can see what the analyzer is telling you from across the room, as opposed to having to put your readers on and get in front of the analyzer.

If the unit requires service, the experience will be much better. The sensors, and all components, can be swapped in situ really by a competent field service engineer or technically savvy end-user. Everything is right there, easy to get to, calibration will be following the moisture cell instead of being on the hard drive, the calibrations are on the moisture cell, or if you get a 760, the calibrations are on the oxygen cell, so all of these things make a much smoother service experience. If or when the inevitable service call comes in, it should be easy to do and make the customer happy.

DB: I know that some of the complaints for the previous generation have been about field serviceability. With all these new components, have you designed in some features that will allow the instrument to be serviced in the field?

PR: You know, everything is accessible, from the power supplies that provide power for the CPU and the moisture sensor, to the boards that contain the relays, analog outputs and serial communications. The solid-state hard drive is right there, easy to access, as is the CPU. Again, getting down to the sensors themselves, if something happens and the unit requires service, a new sensor or sensor swap, for troubleshooting purposes even, which does happen, it’s just a matter of pulling it and putting the sensor into the analyzer. The analyzer will pull the circuit board for that sensor, get all the calibration off of it and you’re up and running. Right? Just like that.

DB: So it’s the hard drive, the CPU, the PCBs, the display, the gas panel, all of those items now can be serviced in the field?

PR: Yes.

DB: Wow. That’s a big step forward. That’s the meat of the components within the analyzer that service engineers usually touch. That’s fantastic. You mentioned that the Herriott cell has been around for quite a long time. How long has it been around and could you tell us a little bit about the Herriott cell?

PR: Yeah, the Herriott cell is old technology that was invented in 1965 by the aptly named Donald Herriott. And it consists of two spherical mirrors, with an aperture in one of them, that allows the light from the laser to enter and exit the Herriott cell. It gives you a very long path length, up to 93 passes, which is about a 50-meter path length. So that’s essentially what a Herriott cell is, spherical mirrors with the light from the laser bouncing back and forth between them.

DB: So I know that the Herriott cell is where the actual sample or measurement is taken. Specifically, Servomex uses Tunable Diode Laser Absorption Spectroscopy inside that Herriott cell. Tell the listeners a little bit about the benefits and features of Tunable Diode Laser.

PR: The Tunable Diode Laser is a neat technology, but we’re looking at it as an absorption spectrometer. So we have to know the wavelength at which moisture absorbs light. And in this case we use 1854 nanometers where you get the laser output tuned to that output frequency by adjusting the temperature on the laser. Each laser has its own unique characteristics and so the laser temperature is unique for each laser.

And once we get the moisture peak tuned in, we modulate the current to that laser, which essentially causes that output to scan across the moisture peak. The moisture peaks at 1854. So we go from, say 1853 and a half to 1854 and a half, and one nanometer, by modulating the current to that laser and slightly affecting the output frequency of that laser.

So, you’re scanning across the moisture peak literally thousands of times a second, and you’re getting a lot of information out of there. It is a direct reading spectrometer. It will compare with the CRDS technology, which is also widely used in the semiconductor industry. CRDS is Cavity Ring-Down Spectroscopy, and what that does, is that emits a pulse of light within the sample cell. It goes between two highly reflective mirror surfaces and they measure the decay time, essentially, for that light to completely decay beyond detectable limits. And that sounds all well and good, but, you know, you’re measuring time, you’re not measuring moisture. And if those mirrors become fogged, or lose any of the reflectivity, it’s going to greatly impact the sensitivity of the device, and the detection limit of the device.

DB: That’s quite a difference. I mean, the only thing that’s basically the same between those two is the laser. They’re very different after that light enters into the chamber.

PR: They use a different frequency than we do as well. They use 1392 nanometers as opposed to ours, which is 1854. But that’s a minor difference there, really.

DB: You mentioned that we used the 1854 wavelength for our measurement. I picked up on something you said about being able to know the centroid of that 1854 wavelength. Could you tell the listeners a little bit more about that?

PR: Okay. Well, what we do is we have what we call a reference peak that the analyzer utilizes to keep the laser tuned properly. Our sensor is divided into two sections. We’ve got the Herriott cell, which is where the sample gas is, and the lasers, and then we have the laser chamber itself, which is isolated from the Herriott cell, and is hermetically sealed and pressurized deep out to keep out contamination.

And we separate the laser chamber from the Herriott cell with a little sapphire window. There’s a small amount of light that reflects off of that window, probably close to, you know, 1% or even less of the light from the laser, is reflected off that window back through. We have a little cuvette out there that contains moisture, so that reflective laser passes through that cuvette to a separate detector. Now there’s always moisture in there, and so the reference detector always shows a moisture peak. The software of the analyzer is designed to recognize that peak and if it sees that peak moving a little bit one way or the other, up or down in wavelength, it will adjust the current being supplied to that laser just a little bit to ensure that the peak stays in the right location and thus the laser is tuned to the proper output frequency.

DB: So if I understand this right, Phil, you’re saying that we use a secondary detector and a cuvette of moisture, and bleed off a little bit of the laser, constantly tell the analyzer where the moisture peak is, and make sure that it doesn’t deviate from that wavelength.

PR: That’s correct.

DB: Another piece that I heard you say during your explanation of Tunable Diode Laser Absorption Spectroscopy was this moisture peak sweep operation. How does that benefit our customers, that the analyzer and our laser technology sweeps across the entire peak?

PR: The sweeping across the peak, there’s a lot going on there. As you sweep across the peak, you’re measuring the brightness of the laser both on-peak and off-peak as you scan across that wavelength. The nature of this measurement is ratiometric. So unlike the cavity ring down, which you discussed earlier, if we lose a little bit of reflectivity due to optical fogging or who knows what real-life sort of things might happen to an instrument in an industrial application, you lose a little bit of reflectivity.

It’s not a big deal at all to analyze to compensate for that automatically, because the light will decrease, the intensity of light will decrease, both on-peak and off-peak, by the same percentage. So the ratio at any given moisture concentration between the on-peak measurement and the off-peak measurement is going to be the same at any given moisture concentration.

So if you lose 10% of your reflectivity – that’s both on-peak and off-peak – and if the ratio between the on-peak and off-peak measurement is going to stay the same, the measurement accuracy is going to stay the same. We had some years ago, we had an analyzer that lost more than 90% of its reflectivity due to contamination. We fired that up in our lab and tested against our known standards and it was still reading accurately with a greater than 90% reflectivity. I have to say I was surprised when that happened, but it gave me faith in the product.

DB: Wow, a 90% loss in an actual intensity of the laser and still measuring accurately, that’s amazing.

PR: It was astonishing to me, quite honestly. There it was. It worked.

DB: So sweeping across the peak, if you lose reflectivity or intensity, you could lose intensity from either the detector and its ability to pick it up, or the laser source. Would not this also calibrate out differences in the laser source and detector?

PR: Anything that has to do with the intensity of the light, be it the output of the laser degrading over the years, the output characteristics of the detector degrading over the years, or the reflectivity of the mirrors being affected by process conditions, all of this, from an algorithmic standpoint, it doesn’t matter to the algorithm.

DB: Say there was an interfering gas in with the background gas and you went off-peak, and it did absorb the laser, that interfering gas would be attenuated and you could calibrate that out?

PR: Yes, it would just be offset out anyways. You’re looking at the center peak, you’re not looking at anything off to the side. And moisture is rather specific at 1854, so in general, interfering elements are pretty much just offset out of there.

DB: So interfering elements, a difference in the intensity of the laser source, a difference in the ability to detect that source, and any kind of contamination on the mirror is instantaneously tenuously zeroed out of the analyzer for you and corrected for?

PR: Yeah.

DB: That’s amazing. No wonder this technology’s been around so long and is used in so many different places like ultra-high purity, semiconductor applications, specialty gas, the electronics market, LED, and display manufacturing.

Thank you so much for taking your time today, Phil, and discussing the amazing capabilities of Tunable Diode Laser and the new Gen-7 DF-700 product. I’d like to thank you for your time.

PR: You’re entirely welcome. This has been a fun thing to do.

DB: And I would like to remind all our listeners to visit servomex.com and find out more about the Gen-7 analyzer online. Thank you.

 


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